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Abilities Towards Improved Accuracy in EPMA

Published online by Cambridge University Press:  30 July 2021

Frank Eggert*
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Llovet, X et al. , Progress in Materials Science 116 (2021) 100673CrossRefGoogle Scholar
Rafaelsen, J, Mu, S, Microsc. Microana l. 26 Suppl 2 (2020) 2174Google Scholar
Elam, W T, Ravel, B D, Sieber, J R Radiation Physics and Chemistry 63/2 (2002) 121CrossRefGoogle Scholar
Eggert, F, Microscopy Today 28/2 (2020) 34CrossRefGoogle Scholar
Ritchie, N et al. , Microsc. Microanal. 26 Suppl 2 (2020) 1774CrossRefGoogle Scholar