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Analysis of Catalysts using Aberration-Corrected TEM

Published online by Cambridge University Press:  03 August 2008

S Rozeveld ,
DA Blom ,
LF Allard ,
T Richardson ,
C Todd  and
JH Blackson
S Rozeveld
Affiliation:
The Dow Chemical Company
DA Blom
Affiliation:
University of South Carolina
LF Allard
Affiliation:
Oak Ridge National Laboratory
T Richardson
Affiliation:
The Dow Chemical Company
C Todd
Affiliation:
The Dow Chemical Company
JH Blackson
Affiliation:
The Dow Chemical Company
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1390 - 1391
Copyright
© 2008 Microscopy Society of America

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