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Analysis of the Atomic Scale Oxygen Vacancy Ordering by EELS and Z-Contrast Imaging

Published online by Cambridge University Press:  02 July 2020

Y. Ito ,
S. Stemmer ,
R.F. Klie ,
N.D. Browning  and
T.J. Mazanec
Y. Ito
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
S. Stemmer
Affiliation:
Department of Mechanical Engineering and Materials Science (MS 321), Rice University, 6100 Main Street, Houston, TX77005-1892
R.F. Klie
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
N.D. Browning
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
T.J. Mazanec
Affiliation:
BP Amoco Chemicals, 150 West Warrenville Road, P.O. Box 3011, Naperville, IL60566-7011
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Extract

Perovskite-type oxides with high electronic and ionic conductivity are very promising materials for use as dense ceramic membranes for oxygen separation. For the successful implementation of practical ceramic membranes, a full understanding of the parameters controlling the degree of non-stoichiometry, i.e. the defect chemistry is essential. A combination of Z-contrast imaging and electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) can be used to directly image crystal and defect structures and the effect of the structures on the local electronic properties (i.e. oxygen coordination and cation valence). Here the defect chemistry in SrCoO3-δ before and after a reduction treatment at high temperatures is investigated in the JEOL 201 OF STEM. This material is known to exist in a wide a variety of phases with different crystal structures, compositions and valence states of cobalt, and can be highly oxygen deficient.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 192 - 193
Copyright
Copyright © Microscopy Society of America

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References

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