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Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi

Published online by Cambridge University Press:  03 September 2021

Benjamin Klaes Open the ORCID record for Benjamin Klaes [Opens in a new window] ,
Jeoffrey Renaux ,
Rodrigue Lardé ,
Fabien Delaroche ,
Felipe F. Morgado ,
Leigh T. Stephenson Open the ORCID record for Leigh T. Stephenson [Opens in a new window] ,
Baptiste Gault Open the ORCID record for Baptiste Gault [Opens in a new window]  and
François Vurpillot
Benjamin Klaes*
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France
Jeoffrey Renaux
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France
Rodrigue Lardé
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France
Fabien Delaroche
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France
Felipe F. Morgado
Affiliation:
Max-Planck Institut für Eisenforschung GmbH, Düsseldorf D-40237, Germany
Leigh T. Stephenson
Affiliation:
Max-Planck Institut für Eisenforschung GmbH, Düsseldorf D-40237, Germany
Baptiste Gault
Affiliation:
Max-Planck Institut für Eisenforschung GmbH, Düsseldorf D-40237, Germany Department of Materials, Royal School of Mines, Imperial College, Prince Consort Road, London SW7 2BP, UK
François Vurpillot
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, Rouen 76000, France Max-Planck Institut für Eisenforschung GmbH, Düsseldorf D-40237, Germany
*
Corresponding author: Benjamin Klaes, E-mail: benjamin.klaes1@univ-rouen.fr
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Abstract

Three-dimensional field ion microscopy is a powerful technique to analyze material at a truly atomic scale. Most previous studies have been made on pure, crystalline materials such as tungsten or iron. In this article, we study more complex materials, and we present the first images of an amorphous sample, showing the capability to visualize the compositional fluctuations compatible with theoretical medium order in a metallic glass (FeBSi), which is extremely challenging to observe directly using other microscopy techniques. The intensity of the spots of the atoms at the moment of field evaporation in a field ion micrograph can be used as a proxy for identifying the elemental identity of the imaged atoms. By exploiting the elemental identification and positioning information from field ion images, we show the capability of this technique to provide imaging of recrystallized phases in the annealed sample with a superior spatial resolution compared with atom probe tomography.

Keywords

3D FIMAPTatom probe tomographyFeBSifield ion microscopy
Type
Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 28 , Issue 4 , August 2022 , pp. 1280 - 1288
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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