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Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization

Published online by Cambridge University Press:  05 August 2007

M Watanabe ,
H Hojo ,
D Ackland ,
C Kiely  and
D Williams
M Watanabe
Affiliation:
Lehigh University
H Hojo
Affiliation:
Kyoto University
D Ackland
Affiliation:
Lehigh University
C Kiely
Affiliation:
Lehigh University
D Williams
Affiliation:
Lehigh University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1198 - 1199
Copyright
© 2007 Microscopy Society of America

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