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Approaches and Tools for Analyzing Low-loss EELS Spectra and Spectrum Images

Published online by Cambridge University Press:  01 August 2004

Michael K. Kundmann ,
Paul J. Thomas  and
Oleg R. Lourie
Michael K. Kundmann
Affiliation:
Gatan Inc., Pleasanton, California
Paul J. Thomas
Affiliation:
Gatan Inc., Pleasanton, California
Oleg R. Lourie
Affiliation:
Gatan Inc., Pleasanton, California
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 862 - 863
Copyright
© 2004 Microscopy Society of America

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