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Atomic Investigation of Al2O3/GaN Heterostructures Interfaces using Aberration-Corrected STEM Combined with First-Principles Methods

Published online by Cambridge University Press:  03 August 2008

JC Idrobo ,
P Pant ,
J Narayan ,
SJ Pennycook  and
ST Pantelides
JC Idrobo
Affiliation:
Vanderbilt University Oak Ridge National Laboratory
P Pant
Affiliation:
North Caroline State University
J Narayan
Affiliation:
North Caroline State University
SJ Pennycook
Affiliation:
Vanderbilt University Oak Ridge National Laboratory
ST Pantelides
Affiliation:
Vanderbilt University Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1402 - 1403
Copyright
© 2008 Microscopy Society of America

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