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Atomic Resolution in MoS2 Few Layered using Cs-corrected STEM at 80 kV

Published online by Cambridge University Press:  23 November 2012

A. Ponce ,
R. Esparza ,
A. Garcia  and
M. Jose Yacaman
A. Ponce
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
R. Esparza
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
A. Garcia
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
M. Jose Yacaman
Affiliation:
Physics and Astronomy, University of Texas at San Antonio, San Antonio, TX
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1440 - 1441
Copyright
Copyright © Microscopy Society of America 2012

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