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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy

Published online by Cambridge University Press:  03 August 2008

PD Nellist ,
EC Cosgriff ,
PB Hirsch  and
DJ Cockayne
PD Nellist
Affiliation:
University of Oxford, United Kingdom
EC Cosgriff
Affiliation:
University of Oxford, United Kingdom
PB Hirsch
Affiliation:
University of Oxford, United Kingdom
DJ Cockayne
Affiliation:
University of Oxford, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 92 - 93
Copyright
© 2008 Microscopy Society of America

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