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Carbon Nanotube Electrostatic Biprism: Principle of Operation and Proof of Concept
Published online by Cambridge University Press: 01 August 2004
Abstract
During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.
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- Instrumentation and Techniques
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- © 2004 Microscopy Society of America
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