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Characteristic Morphology and Its Properties of Melt-Crystallized Polyethylene Banded Spherulites on Scanning Electron Microscope

Published online by Cambridge University Press:  02 July 2020

Jemyung Park ,
Kyuyoung Eom  and
Ohjun Kwon
Jemyung Park*
Affiliation:
R&D Center of Chemical Technology, Samsung General Chemicals., 103-6, Moonji-Dong, Yusong-Gu, Taejeon, South Korea305-380
Kyuyoung Eom
Affiliation:
R&D Center of Chemical Technology, Samsung General Chemicals., 103-6, Moonji-Dong, Yusong-Gu, Taejeon, South Korea305-380
Ohjun Kwon
Affiliation:
R&D Center of Chemical Technology, Samsung General Chemicals., 103-6, Moonji-Dong, Yusong-Gu, Taejeon, South Korea305-380
*
*(Email: jmykpark@samsung.co.k)
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Abstract

In spite of commercial importance of polyethylene(PE), morphologies of melt crystallized PE have been rarely studied. Although, it was possible to observe polyethylene microstructure, they were based on the observation performed almost exclusively on thin films which were obtained either by casting samples between glass plates, or by microtoming the materials with transmission electron microscope(TEM). Despite the usefulness of TEM for detailed investigation of the polyethylene, it is not suitable for the structure characterization of the bulk samples, for examples, the characterization of a thick testpiece and commercial products of polyethylene itself. For such bulk specimen or thick sample, scanning electron microscope (SEM) is more useful, if the appropriate and reliable sample preparation method is applied.

In this study, we introduce a chemical etching technique for the investigation of melt crystallized polyethylene microstructure by SEM. Especially in this work we studied the characteristic properties and shapes of polyethylene banded spherulite which come from the melt s.

Type
Microscopy in the Real World: Semiconductors and Materials
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 500 - 501
Copyright
Copyright © Microscopy Society of America 2001

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References

1.)Raheil, I.A.Ll-, Share, M.Al-, J.Appl.Polym.Sci.(1999), vol. 72, 1125–1129.3.0.CO;2-6>CrossRefGoogle Scholar
2.)OHey, R.H. and Bassett, D.C.(1989), Polymer, 30, 399–409.Google Scholar
3.)Park, J.M. (1999), KoreanJ.Electron Microscopy, vol 29, No.4.,405–415.Google Scholar
4.)Woo, S.S., Park, J.M., Eom, K.Y. and Kwon, O.J. (2000), Microscopy Today, p10∼14 (Oct, 2000).Google Scholar
5.)Park, J.M., Eom, K.Y., Kwon, O.J. and Woo, S.S. (2001), Microscope & Microanalsyis, in press.Google Scholar