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Characterization Of SiOx Smoke Particles by Electron Energy Loss Spectroscopy and Energy-Filtering Imaging

Published online by Cambridge University Press:  02 July 2020

D.C. Dufner
Affiliation:
Electron Microscopy Center, Texas A&M University, College Station, TX77843
S. Danczyk
Affiliation:
Department of Mechanical Engineering, Texas A&M University, College Station, TX77843
M. Wooldridge
Affiliation:
Department of Mechanical Engineering and Applied Mechanics, University of Michigan, 2156 G.G. Brown, 2350 Hay ward, Ann Arbor, MI48109
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Extract

Combustion synthesis has led to many advances in materials science, in part via the synthesis of powders consisting of particles of nanometer dimensions. Particle morphology is a key concern regarding the powders produced, but also of comparable importance is particle composition. Electron energy loss spectroscopy (EELS) and energy-filtering imaging (EFI) can be used to interrogate the gas-phase combustion synthesis environment for elemental particle composition information. Once established, this diagnostic approach can be used to address control of particle composition and other issues associated with particle formation and growth in flames. The evolution of the particle morphology in a laboratory scale combustion synthesis facility can be examined by passing TEM grids directly through the combustion synthesis flame at various heights above the burner surface, as shown in Fig. la. For the current work, SiOx particle samples are obtained from a SilL/^/FL/Ar flame using a rapid probe insertion technique.

Type
Compositional Imaging and Spectroscopy
Copyright
Copyright © Microscopy Society of America

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References

1.Dobbins, R.A. and Megaridis, C.M., Langmuir 3(1987)254.CrossRefGoogle Scholar
2. Support provided by the National Science Foundation (Grant CTS 98-96272, program monitor Dr.Fisher, Farley) and use of instrumentation at the Texas A&M University Electron Microscopy Center and the Arizona State University Center for High Resolution Electron Microscopy are gratefully acknowledged. The authors also thank Dr.Crozier, Peter, Al, Higgsand Karl, Weiss of Arizona State University for their assistance on the instrumentsGoogle Scholar