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Charge Contrast Imaging (CCI) in the Environmental Scanning Electron Microscope: Optimizing Operating Parameters for Calcite

Published online by Cambridge University Press:  02 July 2020

Eric Doehne  and
David Carson
Eric Doehne
Affiliation:
The Getty Conservation Institute, 1200 Getty Center Drive, Suite 700, Los Angeles, CA, 90049, USA TEL: (310) 440 6237 Email:edoehne@gettv.edu
David Carson
Affiliation:
The Getty Conservation Institute, 1200 Getty Center Drive, Suite 700, Los Angeles, CA, 90049, USA TEL: (310) 440 6237 Email:edoehne@gettv.edu
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Abstract

Charge contrast imaging (CCI) is a useful new method for imaging sub-micron features in crystalline materials using the unique gas/ion/electron imaging system of the environmental scanning electron microscope (Griffin, 1997; Doehne, 1998). Crystal growth zoning, microfractures, solution boundaries, and areas of chemical alteration or recrystallization can be imaged in a wide range of materials (Griffin, 2000; Watt, et al. 2000). While not fully understood, charge contrast images reflect differences in the ability of materials to accept, store and discharge deposited electrons from the primary electron beam. These differences are expressed, in turn, as contrasts in secondary electron emission from flat samples (e.g. these contrasts are not related to topography, as is usually the case). Charge contrast appears be related to differences in electronic properties which are often controlled by defect density. CCI is also affected by small-scale physical defects (such as microfractures) which appear to affect the distribution and timing of charge buildup and discharge in the sample (Johansen, et al. 1997).

Type
Technologists’ Forum: ESEM/Lv/Vp: Imaging at Low Vacuum (Organized by J. Killius)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 780 - 781
Copyright
Copyright © Microscopy Society of America 2001

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References

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