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A Comparison of Microcalorimeter and Conventional Semiconductor EDS

Published online by Cambridge University Press:  01 August 2004

Hendrix Demers ,
Raynald Gauvin ,
I M Anderson ,
D C Joy  and
E A Kenik
Hendrix Demers
Affiliation:
McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada
I M Anderson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennesee
D C Joy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennesee
E A Kenik
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennesee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 106 - 107
Copyright
© 2004 Microscopy Society of America

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