Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-24T13:04:41.642Z Has data issue: false hasContentIssue false
  • English
  • Français

Development and Application of an Internet Electron Microscopy System for the Outreach Program in Japan

Published online by Cambridge University Press:  03 March 2008

Miyoko Tanaka ,
Akane Tameike ,
Nobuhiro Ishikawa  and
Kazuo Furuya
Miyoko Tanaka
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan
Akane Tameike
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan
Nobuhiro Ishikawa
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan
Kazuo Furuya
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan
Get access

Abstract

The development of a remotely operated scanning electron microscopy (SEM) system and its use by high school students and the public as an outreach program are reported. The SEM and the server are located in the National Institute for Materials Science, Tsukuba, Japan, with client computers installed at a science museum and high schools. Using a secure virtual private network system and scheduling/management groupware, observation of SEM images and energy dispersive X-ray analysis are widely and frequently performed throughout Japan.

Keywords

remote controlInternetSEMoutreachnetworkgroupware
Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Issue 2 , April 2008 , pp. 176 - 183
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Chand, G., Breton, B.C., Caldwell, N.H.M. & Holburn, D.M. (1997). World wide web-controlled scanning electron microscope. Scanning 19, 292–296.Google Scholar
Chumbley, L.S., Cassucio, G., Kritikos, D., Lentz, H., Mannes, C. & Mehta, K. (2002). Development of a web-based SEM specifically for K–12 education. Microsc Res Tech 56, 454–461.Google Scholar
Chumbley, L.S., Meyer, M., Fredrickson, K. & Laabs, F. (1995). Computer networked scanning electron microscope for teaching, research, and industry applications. Microsc Res Tech 32, 330–336.Google Scholar
Fan, G.Y., Mercurio, P.J., Young, S.J. & Ellisman, M.H. (1993). Telemicroscopy. Ultramicroscpy 52, 499–503.Google Scholar
Furuya, K., Tanaka, M., Mitsuishi, K., Ishikawa, N., Tameike, A., Date, M., Yamada, A. & Okura, Y. (2005). Public-opened internet electron microscopy 2005 in Japan: Remote-control SEM and TEM for high-school users. Microsc Microanal 11(Suppl. 2), 68–69.Google Scholar
Furuya, K., Tanaka, M., Song, M., Mitsuishi, K., Takeguchi, M., Toda, Y., Tameike, A., Fukushima, K., Yamada, A. & Akimoto, H. (2002). Public opened internet electron microscopy in Japan. In Proceedings of the 15th International Congress on Electron Microscopy 3, Engelbrecht, J., Sewell, T., Witcomb, M., Cross, R. & Richards, P. (Eds.), pp. 243–244. Onderstepoort, South Africa: Microscopy Society of Southern Africa.
Hadida-Hassan, M., Young, S.J., Peltier, S.T., Wong, M., Lamont, S. & Ellisman, M.H. (1999). Web-based telemicroscopy. J Struct Biol 125, 235–245.Google Scholar
Kisseberth, N., Brauer, G., Grosser, B., Potter, C.S. & Carragher, B. (1999). JavaScope: A web-based TEM control interface. J Struct Biol 125, 229–234.Google Scholar
Kisseberth, N., Potter, C.S., Brauer, G.E., Lindquist, J.A., Jatko, M.K. & Carragher, B. (1996). Webscope.TEM: A modular system for distributed TEM. In Proceedings of the 54th Annual Microscopy Society of America Meeting, Bailey, G.W., Corbett, J.M., Dimlich, R.V.M., Michael, J.R. & Zaluzec, N.J. (Eds.), pp. 390–391. San Francisco: San Francisco Press.
Mansfield, J.F., Adamson, A. & Coffman, K. (2000). Development of a system to provide full, real-time remote control of a scanning electron microscope across the second generation internet: The teaching SEM. Microsc Microanal 6, 31–41.Google Scholar
Morgan, C., Pardoe, D. & Smith, N. (1998). Toward a standard for remote microscope control systems. Scanning 20, 110–116.Google Scholar
Noumaru, J. (2000). Observation and observatory operation systems for Subaru telescope. In Proceedings of the International Society for Optical Engineering 4010: Observatory Operations to Optimize Scientific Return II, Quinn, P.J. (Ed.), pp. 10–15. Bellingham, WA: SPIE.
Ohta, T., Fukui, T., Ishii, M., Furukawa, Y., Nakatani, T., Matsushita, T., Takeuchi, M., Tanaka, R. & Ishikawa, T. (2001). Secure network for beamline control. Nucl Instrum Methods Phys Res A 467–468, 825–828.Google Scholar
Parvin, O.L., Agarwal, D., Owen, D., O'Kkeefe, M.A., Westmacott, K.H., Dahmen, U. & Gronsky, R. (1995). A project for on-line remote control of a high-voltage TEM. In Proceedings of the 53th Annual Microscopy Society of America Meeting, Bailey, G.W., Ellisman, M.H., Hennigar, R.A. & Zaluzec, N.J. (Eds.), pp. 82–83. New York: Jones and Begell Publishing.
Potter, C.S., Carragher, B., Carroll, L., Conway, C., Grosser, B., Hanlon, J., Kisseberth, N., Robinson, S., Thakkar, U. & Weber, D. (2001). Bugscope: A practical approach to providing remote microscopy for science education outreach. Microsc Microanal 7, 249–252.Google Scholar
Takaoka, A., Yoshida, K., Mori, H., Hayashi, S., Young, S.J. & Ellisman, M.H. (2000). International telemicroscopy with a 3MV ultrahigh voltage electron microscope. Ultramicroscopy 83, 93–101.Google Scholar
Tameike, A., Furuya, K., Tanaka, M., Mitsuishi, K., Takeguchi, M., Hasegawa, A., Toda, Y., Fukushima, K., Yamada, A. & Akimoto, H. (2004). Public opened internet electron microscopy in educational field. Microsc Microanal 10(Suppl. 2), 1566–1567.Google Scholar
Thorne, B.B., Streel, F.B. & Fahey, A.J. (1998). A multi-instrument virtual collaborative environment via the World-Wide Web at NIST. Microsc Microanal 4(Suppl. 2), 30–31.Google Scholar
Völkl, E., Allard, L.F., Bruley, J. & Williams, D.B. (1997). Undergraduate TEM instruction by telepresence microscopy over the Internet. J Microsc 187, 139–142.Google Scholar
Völkl, E., Allard, L.F., Dodson, T.A. & Nolan, T.A. (1995). Computer control of transmission electron microscopes: Possibilities, concepts and present limitations. In Proceedings of the 53th Annual Microscopy Society of America Meeting, Bailey, G.W., Ellisman, M.H., Hennigar, R.A. & Zaluzec, N.J. (Eds.), pp. 22–23. New York: Jones and Begell Publishing.
Wolf, G., Petersen, D., Dietel, M. & Petersen, I. (1998). Telemicroscopy via the Internet. Nature 391, 613–614.Google Scholar
Yamada, A., Hirahara, O., Tsuchida, T., Sugano, N. & Date, M. (2003). A practical method for the remote control of the scanning electron microscope. J Electron Microsc 52, 101–109.Google Scholar
Youngblom, J.H., Youngblom, J.J. & Wilkinson, J. (2001). TelePresence confocal laser scanning microscopy. Microsc Microanal 7, 241–248.Google Scholar
Zaluzec, N.J. (1995). Tele-presence microscopy: An interactive multi-user environment for collaborative research using high speed networks and the internet. In Proceedings of the 53th Annual Microscopy Society of America Meeting, Bailey, G.W., Ellisman, M.H., Hennigar, R.A. & Zaluzec, N.J. (Eds.), pp. 14–15. New York: Jones and Begell Publishing.