Hostname: page-component-7bb8b95d7b-s9k8s Total loading time: 0 Render date: 2024-10-04T02:15:48.096Z Has data issue: false hasContentIssue false

Development And Applications Of Highly Precise Phase Measurement Technique Using Phase-Shifting Electron Holography

Published online by Cambridge University Press:  02 July 2020

K. Yamamoto
Affiliation:
Department of Electronics, Nagoya University, Chikusa-ku, Nagoya464-8603, Japan
I. Kawajiri
Affiliation:
Department of Electronics, Nagoya University, Chikusa-ku, Nagoya464-8603, Japan
T. Tanji
Affiliation:
CIRSE, Nagoya University, Chikusa-ku, Nagoya464-8603, Japan
M. Hibino
Affiliation:
CIRSE, Nagoya University, Chikusa-ku, Nagoya464-8603, Japan
T. Hirayama
Affiliation:
Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya456-0023, Japan
Get access

Extract

Today's information-oriented society requires high-density, high-quality magnetic recording media. For the development of such new recording materials, the quantitative observation of magnetic fine structures by electron holography is eagerly awaited. However, the magnetic fields around particles smaller than 50 nm have not been observed because they are too weak to be observed in the usual way. Here, we report a highly precise phase measurement technique, improved phase-shifting electron holography. Using this method, we observed weak electric and magnetic fields precisely. The precision of the reconstructed phase image was as good as 2π/300 rad.

In phase-shifting electron holography, the phase images are reconstructed from a series of electron holograms whose interference fringes are shifted relative to one after another. The shifting of interference fringes is achieved by tilting the incident electron beam, which corresponds to shifting the initial phase of the incident electron waves in a specimen plane.

Type
Electron Holography
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Ru, Q. et al.: UTtramicroscopy 55 (1994) 209220CrossRefGoogle Scholar
Hirayama, T. et al.: Jpn. J. Appl. Phys. Vol.34 (1995) p.32943297CrossRefGoogle Scholar