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The Development and Applications of Ultrafast Electron Nanocrystallography

Published online by Cambridge University Press:  03 July 2009

Chong-Yu Ruan ,
Yoshie Murooka ,
Ramani K. Raman ,
Ryan A. Murdick ,
Richard J. Worhatch  and
Aric Pell
Chong-Yu Ruan*
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
Yoshie Murooka
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
Ramani K. Raman
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
Ryan A. Murdick
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
Richard J. Worhatch
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
Aric Pell
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, Michigan 48824, USA
*
Corresponding author. E-mail: ruan@pa.msu.edu
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Abstract

We review the development of ultrafast electron nanocrystallography as a method for investigating structural dynamics for nanoscale materials and interfaces. Its sensitivity and resolution are demonstrated in the studies of surface melting of gold nanocrystals, nonequilibrium transformation of graphite into reversible diamond-like intermediates, and molecular scale charge dynamics, showing a versatility for not only determining the structures, but also the charge and energy redistribution at interfaces. A quantitative scheme for 3D retrieval of atomic structures is demonstrated with few-particle (<1,000) sensitivity, establishing this nanocrystallographic method as a tool for directly visualizing dynamics within isolated nanomaterials with atomic scale spatio-temporal resolution.

Keywords

ultrafast electron nanocrystallographystructural dynamicsfemtosecond lasernanomaterialscharge transportphotovoltage
Type
Special Section: Ultrafast Electron Microscopy
Information
Microscopy and Microanalysis , Volume 15 , Issue 4 , August 2009 , pp. 323 - 337
Copyright
Copyright © Microscopy Society of America 2009

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References

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