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Development of a Combined Scanning Ion-Conductance and Nearfield Optical Microscope to Image Living Cells

Published online by Cambridge University Press:  02 July 2020

M. Raval ,
D. Klenerman ,
T. Rayment ,
Y. Korchev  and
M. Lab
M. Raval
Affiliation:
Department of Chemistry, University of Cambridge, Lensfield Road, CambridgeCB2 1EWU.K
D. Klenerman
Affiliation:
Department of Chemistry, University of Cambridge, Lensfield Road, CambridgeCB2 1EWU.K
T. Rayment
Affiliation:
Department of Chemistry, University of Cambridge, Lensfield Road, CambridgeCB2 1EWU.K
Y. Korchev
Affiliation:
Imperial College School of Medicine, Division of Medicine, 5th floor, MRC Clinical Sciences Centre, Hammersmith Campus, Du Cane Road, LondonW12 ONNU.K
M. Lab
Affiliation:
Imperial College School of Medicine, Division of Medicine, 5th floor, MRC Clinical Sciences Centre, Hammersmith Campus, Du Cane Road, LondonW12 ONNU.K
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Extract

It is important to be able to image biological samples in a manner that is non-invasive and allows the sample to retain its functionality during imaging.

A member of the SPM (scanning probe microscopy) family, SNOM (scanning near-field optical microscopy), has emerged as a technique that allows optical and topographic imaging of biological samples whilst satisfying the above stated criteria. The basic operating principle of SNOM is as follows. Light is coupled down a fibre-optic probe with an output aperture of sub-wavelength dimensions. The probe is then scanned over the sample surface from a distance that is approximately equal to the size of its aperture. By this apparently simple arrangement, the diffraction limit posed by conventional optical microscopy is overcome and simultaneous generation of optical and topographic images of sub-wavelength resolution is made possible. Spatial resolution values of lOOnm in air and 60nm in liquid[1,2] are achievable with SNOM.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 976 - 977
Copyright
Copyright © Microscopy Society of America

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References

1.)Keller, T. H et al., Review of Scientific Instruments, 68(3), p. 1448, 1997.CrossRefGoogle Scholar
2.)Mertesdorf, M. et al., Surface and Interface Analysis, 25(10), p.755, 1997.3.0.CO;2-H>CrossRefGoogle Scholar
3.) Sutter Instruments Company, 40 Leveroni Court, Novato, CA 94949.Google Scholar
4.)Hoffmann, P. et al., Ultramicroscopy, 61(1-4), p. 165, 1996.CrossRefGoogle Scholar
5.)Hansma, P. K et al., Science, 243, p.641, 1989.CrossRefGoogle Scholar
6.)Korchev, Y. E et al., Journal of Microscopy, 188(1), p.17, 1997.CrossRefGoogle Scholar