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Development of Double-Probe Piezo-Driving Holder for TEM

Published online by Cambridge University Press:  03 August 2008

K Yamazaki
Affiliation:
JEOL Japan
I Ishikawa
Affiliation:
JEOL Japan
S Deguchi
Affiliation:
JEOL Japan
Y Kondo
Affiliation:
JEOL Japan
Y Murakami
Affiliation:
Tohoku University, Japan
D Shindo
Affiliation:
Tohoku University, Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Copyright
© 2008 Microscopy Society of America

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