Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-29T09:14:12.054Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Observation of Growth Behaviour of Athermal Omega-Phase Crystals in a Beta-Titanium Alloy Due to Cooling to 77k Using In-Situ Dark Field Imaging Technique

Published online by Cambridge University Press:  02 July 2020

Hajime Matsumoto ,
Eiichi Sukedai  and
Hatsujiro Hashimoto
Hajime Matsumoto
Affiliation:
Graduate School, Okayama University of Science, Okayama, 700-0005, Japan
Eiichi Sukedai
Affiliation:
Faculty of Engineering, Okayama University of Science, Okayama, 700-0005, Japan
Hatsujiro Hashimoto
Affiliation:
Faculty of Engineering, Okayama University of Science, Okayama, 700-0005, Japan
Get access

Extract

INTRODUCTION

It has been reported by many authors that metastable β-Ti alloys such as Ti-Nb, Ti-V and Ti- Mo indicate the negative temperature dependence of electrical resistivity at low temperature since Ames et al., found the dependence on Ti-Nb alloys in 1954. Williams et al., suggested that the phenomenon resulted from formation of athermal co-phase crystals. In order to clarify the origin, electron diffraction pattern analyses were carried out using a specimen cooling stage and both of start and finish temperatures of formation of athermal co-phase crystals were decided. However, it is necessary to reveal the morphology of athermal ω-phase crystals to study the relationship between the electrical resistivity change and appearance of athermal ω-phase crystals. On the other hand, although electron diffraction pattern analyses are able to identify the atomic structures of crystals, which appear the diffraction spots, it is not so easy to reveal the detailed morphology of the crystals. Also, it has to consider effects of electron irradiation to transformations.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 700 - 701
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1:Ames, S.L. and McQuillan, A.D., Acta Metall., 2 (1954) 831–836.CrossRefGoogle Scholar
2:Williams, J.C., de Fontaine, D. and Paton, N.E., Metal. Trans., 4 (1973) 2701–2708.CrossRefGoogle Scholar
3:Ikeda, M., Komatsu, S.Y., Sugimoto, T. and Kamai, K., 6th World Conf. Ti, Ed. by Lacombe, P.et al., de physique, (1988) 313-318.Google Scholar