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The Effect of Local Symmetry on Atomic Resolution EELS Near-Edge Structures: Predictions for Grain Boundaries In NiAl

Published online by Cambridge University Press:  02 July 2020

D. A. Pankhurst ,
G. A. Botton  and
C. J. Humphreys
D. A. Pankhurst
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ., Great Britain.
G. A. Botton
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ., Great Britain. Materials Technology Laboratory, CANMET, 568 Booth Street, Ottawa., CanadaK1A 0G1.
C. J. Humphreys
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ., Great Britain.
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Extract

It has been demonstrated that electron energy loss spectrometry (EELS) can be used to probe the electronic structure of materials on the near-atomic scale. The electron energy loss near edge structure (ELNES) observed after the onset of a core edge reflects a weighted local density of final states to which core electrons are excited by fast incident electrons. Lately ‘atomic resolution EELS’ and ‘column-by-column spectroscopy’ have become familiar themes amongst the EELS community. The next generation of STEMs, equipped with spherical aberration (Cs) correctors and electron beam monochromators, will have sufficient spatial and energy resolution, along with the superior signal to noise required, to detect small changes in the ELNES from atomic column to atomic column.

Core loss ELNES provides information about unoccupied states, but the structure observed in spectra is sensitive to changes in the underlying occupied states, and thus to the bonding in the material.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 186 - 187
Copyright
Copyright © Microscopy Society of America

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References

1.Blaha, P. et al., WIEN97, A Full Potential Linearised Augmented Plane Wave Package for Calculating Crystal Properties (Karlheinz Schwarz, Techn. Universitat Wien, Austria), 1999. ISBN 3-9501031-0-4Google Scholar
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3. Results to be publishedGoogle Scholar
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5. We would like to thank Professor M. Finnis for providing the relaxed atomic co-ordinates for the grain boundary calculationGoogle Scholar