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Effect of Staining on Latex Particle Size Examined by Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

Y. Ming ,
H. Doumaux ,
L. E. Scriven  and
H. T. Davis
Y. Ming
Affiliation:
Department of Chemical Engineering & Materials Science, and Center for Interfacial Engineering, University of Minnesota, Minneapolis, MN55455
H. Doumaux
Affiliation:
Department of Chemical Engineering & Materials Science, and Center for Interfacial Engineering, University of Minnesota, Minneapolis, MN55455
L. E. Scriven
Affiliation:
Department of Chemical Engineering & Materials Science, and Center for Interfacial Engineering, University of Minnesota, Minneapolis, MN55455
H. T. Davis
Affiliation:
Department of Chemical Engineering & Materials Science, and Center for Interfacial Engineering, University of Minnesota, Minneapolis, MN55455
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Extract

Electron microscopy has been an invaluble tool to the study of polymer morphology, especially latex particles, microphase-separated block copolymers, and polymer blends. However, in order to examine these materials in an electron microscope, the sample often needs to be stained to heighten contrast between locales of different composition in the specimen. Staining usually has the following advantages: heightened contrast; higher polymer glass transition temperature Tg; lowered charging; and reduced radiation damage. However, staining can also introduce artifact. It is reported that the latex particle size is raised and the polybutadiene “sphere” in block copolymers is lowered after staining. This indicates that the staining process may be complex.

Recently, low voltage field emission scanning electron microscopy (LVFESEM), especially high-resolution backscattered electron imaging produced with staining, has been used to study latex film formation, latex particle deformation and adhesion on substrates, latex particle deformation, distribution and binding in paper coatings.

Type
Low Voltage SEM Imaging and Analysis for the Biological and Materials Sciences
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1239 - 1240
Copyright
Copyright © Microscopy Society of America 1997

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References

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5. Thanks go to Prof. S. Erlansen for access to the Hitachi S-900 FESEM, and to his associate, C. Frethem for technical assistance. The latexes were supplied by BASF Corporation.Google Scholar