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Electron Diffraction Analysis and Determination of Se Phase Formed by Reduction of Oxoselenium Anions by Iron (II) Hydroxide

Published online by Cambridge University Press:  02 July 2020

D. C. Dufner ,
R. A. Zingaro ,
A. P. Murphy  and
C. D. Moody
D. C. Dufner
Affiliation:
Electron Microscopy Center, Texas A&M University, College Station, TX77843
R. A. Zingaro
Affiliation:
Department of Chemistry, Texas A&M University, College Station, TX77843
A. P. Murphy
Affiliation:
U. S. Department of the Interior, Bureau of Reclamation, Engineering and Research Center, Denver, CO80225
C. D. Moody
Affiliation:
U. S. Department of the Interior, Bureau of Reclamation, Engineering and Research Center, Denver, CO80225
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Extract

Since the early 1980s, Se toxicity in wildlife has created a great deal of interest and concern. Reservoirs, marshes, and wetlands in which excessive amounts of Se have been found are considered to be the source of their toxicity problems. Thus, an effective and inexpensive treatment of Se-contaminated waters which significantly lowers the concentration of this element is needed. One such method for removing selenites and selenates from water utilizes iron (II) hydroxide as a reducing agent. In this work, the reduction products are analyzed in the transmission electron microscope (TEM) using electron diffraction and energy-dispersive spectroscopy (EDS) to determine the presence of Se.

A “standard” aqueous solution was prepared by the addition of KOH to distilled water to pH 8.8. Sufficient quantities of Na2SeO3 or Na2SeO4 were weighed and dissolved in the “standard” solution to yield SeO3-2 or SeO4-2 ions. A weighed quantity of Fe(NH4)2(SO4)2 was then added to the SeO3-2 or SeO4-2 “standard” solution to form a precipitate of iron hydroxide.

Type
Geology and Mineralogy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 755 - 756
Copyright
Copyright © Microscopy Society of America 1997

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References

Zingaro, R. A.et al., Environment International, in press.Google Scholar
Murphy, A. P., Ind. Eng. Chem. 27(1988)187.10.1021/ie00073a033CrossRefGoogle Scholar
Dufner, D. C., Proc. Ann. MSA Meeting 54(1996)594.Google Scholar
The support of this research by the Robert A. Welch Foundation, Houston, Texas, and the use of the instrumentation in the Texas A&M University Electron Microscopy Center are gratefully acknowledged.Google Scholar