Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T21:37:57.674Z Has data issue: false hasContentIssue false

Electron Holography and Digital Imaging for Analysis of Nanostructured Materials

Published online by Cambridge University Press:  02 July 2020

L. F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN
E. Voelkl
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN
A. K. Datye
Affiliation:
Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, NM
A. H. Carim
Affiliation:
Department of Materials Science and Engineering, Penn State University, State College, PA
Get access

Extract

Many nanostructured materials are formed from powder precursors having ultra-fine particle sizes. Techniques of electron microscopy have proven invaluable for characterizing the structure of the precursor materials in order to better understand the fundamental processes that govern consolidation of the materials into the final nanophase structures. In recent years, the rapidly developing technique of electron holography has increasingly been applied for characterizing particle morphologies. The advent of the modern field emission microscope, which offers beam coherency sufficient to produce high contrast interference fringes for optimum hologram formation, and especially the availability of digital camera systems for hologram acquisition and rapid processing have both combined to bring electron holography to the forefront of techniques for characterization of nanostructured materials.

Electron holograms typically yield phase images that can give quantitative information on crystal morphologies, but much additional information can result from digital processing of holograms.

Type
Nanophase and Amorphous Materials
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Voelkl, E., et al., Proc. Micros. & Microanal. 1995, Bailey, G.W. et al., eds., Jones & Begell, 616.Google Scholar
2. Research sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed for the Department of Energy by Lockheed Martin Energy Research Corp., under contract DE-AC05-96OR22464.Google Scholar