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Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors

Published online by Cambridge University Press:  03 August 2008

L Li ,
NT Nuhfer  and
M Skowronski
L Li
Affiliation:
Carnegie Mellon University
NT Nuhfer
Affiliation:
Carnegie Mellon University
M Skowronski
Affiliation:
Carnegie Mellon University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 624 - 625
Copyright
© 2008 Microscopy Society of America

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