Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-24T23:00:36.090Z Has data issue: false hasContentIssue false
  • English
  • Français

Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si

Published online by Cambridge University Press:  01 August 2004

Sanjay V. Khare ,
Serge M. Nakhmanson ,
Paul M. Voyles ,
Pawel Keblinski  and
John R. Abelson
Sanjay V. Khare
Affiliation:
University of Illinois Urbana-Champaign
Serge M. Nakhmanson
Affiliation:
North Carolina State University
Paul M. Voyles
Affiliation:
University of Wisconsin Madison
Pawel Keblinski
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York
John R. Abelson
Affiliation:
University of Illinois Urbana-Champaign
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 820 - 821
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)