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Extended and Point Defects in Diamond Studied With the Aid of Various Forms of Microscopy

Published online by Cambridge University Press:  02 July 2020

J.W. Steeds
J.W. Steeds*
Affiliation:
Department of Physics, University of Bristol, Bristol, BS8 1TL, UK
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Extract

Introduction

There is considerable interest in CVD diamond layers for a wide variety of applications. Growth of high quality and phase pure material is now achieved in a number of laboratories but it remains to optimize the growth process for particular applications so that physical properties approaching or even exceeding those of the best natural diamond can be achieved. We have found that the combined use of a wide range of different microscopies is effective in the process of refinement.

Diamond quality and phase purity

Raman spectroscopy is widely used to investigate the phase purity of diamond layers. Infra-red Raman is particularly sensitive to the presence of traces of non-diamond carbon in diamond while ultra-violet Raman reveals the presence of traces of diamond carbon in layers that largely are not sp bonded. For thick rather perfect layers confocal micro-Raman mapping is a convenient method for revealing the locations of non-diamond regions.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 660 - 661
Copyright
Copyright © Microscopy Society of America

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References

[1]Steeds, J.W.et al.,Diamond & Related Materials. 7 (1998) 1437–1450.CrossRefGoogle Scholar
[2]Burton, N.C.et al., Diamond & Related Materials. 4 (1995) 1222–1234.CrossRefGoogle Scholar
[3]Pickard, C.D.O.et al., Diamond & Related Materials. 1 (1998) 238–242.CrossRefGoogle Scholar
[4]Steeds, J.W.et al.,“Creation and mobility of self-interstitials in diamond by use of a transmission electron microscope and their subsequent study by photoluminescence microscopy”. Accepted by Diamond and Related Materials 1999.CrossRefGoogle Scholar
[5]Steeds, J.W.et al.,“Use of novel methods for the investigation of the boron distribution in CVD diamond”. Accepted by Acta Materialia 1999.CrossRefGoogle Scholar
[6]Steeds, J.W.et al.,“On the nature of grain boundary defects on high quality CVD diamond and their influence on physical properties”. Accepted by Diamond & Related Materials 1999CrossRefGoogle Scholar