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FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors

Published online by Cambridge University Press:  23 November 2012

N. Bassim ,
A. Aifer ,
E. Jackson ,
J. Nolde ,
C. Affouda ,
C. Canedy ,
I. Vurgaftman ,
J. Meyer  and
S. Maximenko
N. Bassim
Affiliation:
Naval Research Laboratory, Washington, DC
A. Aifer
Affiliation:
Naval Research Laboratory, Washington, DC
E. Jackson
Affiliation:
Naval Research Laboratory, Washington, DC
J. Nolde
Affiliation:
Naval Research Laboratory, Washington, DC
C. Affouda
Affiliation:
Naval Research Laboratory, Washington, DC
C. Canedy
Affiliation:
Naval Research Laboratory, Washington, DC
I. Vurgaftman
Affiliation:
Naval Research Laboratory, Washington, DC
J. Meyer
Affiliation:
Naval Research Laboratory, Washington, DC
S. Maximenko
Affiliation:
Global Defense Technology&Systems, Inc., Crofton, MD
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1806 - 1807
Copyright
Copyright © Microscopy Society of America 2012

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