Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-24T18:32:28.563Z Has data issue: false hasContentIssue false
  • English
  • Français

HARECX Measurements of Electron Channeling Effects on Quantitative AEM-Based XEDS

Published online by Cambridge University Press:  02 July 2020

Nestor J. Zaluzec
Nestor J. Zaluzec*
Affiliation:
Materials Science Div, Argonne National Laboratory, Argonne, IL. 60439, USA
Get access

Extract

It has been long known that orientation effects in crystalline materials can influence characteristic x-ray emission and microanalysis. Most of the recent studies have concentrated upon using the phenomenon to perform site specific distributions of impurity elements in ordered compounds using the ALCHEMI methodology. For the most part, it has been asserted that increasing the parameters of thickness, orientation and beam convergence effectively averages out these effects. Using High Angular Resolution Electron Channeling X-ray Spectroscopy (HARECXS) we have carefully measured the phenomenon in a number of ordered systems and find that it must be considered in many cases.

All experimental measurements presented here were conducted on a Philips EM 420T analytical electron microscope. The instrument was operated in the TEM mode, at 120 kV using a LaB6 electron source. The characteristic x-ray emission was measured using an ED AX ultra thin window Si(Li) detector having a FWHM of ∼ 145 eV at Mn Ka.

Type
Problem Elements and Spectrometry Problems II
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 938 - 939
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.)Duncumb, P.Phil. Mag. 7, 2101 (1962).CrossRefGoogle Scholar
2.)Cowley, J., Acta Crys. l7 33 (1964).Google Scholar
3.)Spence, J. and Tafto, J., J. Microscopy, 130, 147 (1983).CrossRefGoogle Scholar
4.)Anderson, I., Acta. Mater. 45, 3897, (1997) /CrossRefGoogle Scholar
5.)Allen, L.J. etal, Ultramicroscopy 55 258 (1994).CrossRefGoogle Scholar
6.)Zaluzec, N.J., Microscopy & Microanalysis '99, (1999).Google Scholar
7.)Zaluzec, N.J. etal, Microscopy & Microanalysis '97, 983 (1997).CrossRefGoogle Scholar
8.)Matsumura, S., Soeda, T., Zaluzec, N.J., Kinoshita, C., MRS Proc. Dec. 1999. In pressGoogle Scholar
9.) This work was supported by US. DoE under BES-MS W-31-109-Eng-38 at ANL.Google Scholar