Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Tee Irene
Li Kun
Liu Pan
Du Anyan
Sean, Seah
and
Tjioe, Fidelia
2009.
Study of low-kv cleaning method to improve TEM samples prepared by FIB.
p.
552.
Dobrzhinetskaya, Larissa F.
and
Faryad, Shah Wali
2011.
Ultrahigh-Pressure Metamorphism.
p.
1.
Paul, Samit
Chowdhury, Abhishek
and
Bhattacharjee, Sudeep
2012.
Effect of beam limiting aperture and collector potential on multi-element focused ion beams.
Review of Scientific Instruments,
Vol. 83,
Issue. 2,
Estivill, Robert
Audoit, Guillaume
Barnes, Jean-Paul
Grenier, Adeline
and
Blavette, Didier
2016.
Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.
Microscopy and Microanalysis,
Vol. 22,
Issue. 3,
p.
576.
Bruchhaus, L.
Mazarov, P.
Bischoff, L.
Gierak, J.
Wieck, A. D.
and
Hövel, H.
2017.
Comparison of technologies for nano device prototyping with a special focus on ion beams: A review.
Applied Physics Reviews,
Vol. 4,
Issue. 1,
Maurya, Sanjeev Kumar
Paul, Samit
Shah, Jay Kumar
Chatterjee, Sanghamitro
and
Bhattacharjee, Sudeep
2017.
Momentum transfer using variable gaseous plasma ion beams and creation of high aspect ratio microstructures.
Journal of Applied Physics,
Vol. 121,
Issue. 12,
Maurya, Sanjeev Kumar
and
Bhattacharjee, Sudeep
2020.
Variable gaseous ion beams from plasmas driven by electromagnetic waves for nano-micro structuring: a tutorial and an overview of recent works and future prospects.
Plasma Research Express,
Vol. 2,
Issue. 3,
p.
033001.