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High-Resolution Observation of Si100-xVx Amorphous Alloys by HAADF-STEM

Published online by Cambridge University Press:  02 July 2020

N. Tanaka ,
S.J. Penny cook ,
T. Fujiwara ,
T. Fukunaga  and
U. Mizutani
N. Tanaka
Affiliation:
Department of Applied Physics, Nagoya University, Nagoya, 464-01, Japan
S.J. Penny cook
Affiliation:
Solid State Division, Oak-Ridge National Laboratory, Oak-Ridge, TN, 37831-6031, U.S.A.
T. Fujiwara
Affiliation:
Department of Crystalline Materials Science, Nagoya University, 464-01, Japan
T. Fukunaga
Affiliation:
Department of Crystalline Materials Science, Nagoya University, 464-01, Japan
U. Mizutani
Affiliation:
Department of Crystalline Materials Science, Nagoya University, 464-01, Japan
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Extract

A combination of Si and transition metal element like V, Ni and Au can form an amorphous phase over a wide composition range. Extensive studies have been reported in relation to a change in the electron transport properties across the metal-insulator transition. It has been reported that the metal-insulator transition in the amorphous Si100−xVx alloys accompanies a substantial change in both the electronic structure and atomic structure around x=18, as revealed by the photoemission spectroscopy and neutron diffraction experiments[1]. It is of great interest to examine the structural change associated with the metal-insulator transition at an atomic level by utilizing the HRTEM[2]. However, the correspondence between the image contrast and projection of atomic structures in amorphous materials is usually indirect due to the well-known phenomena of phase contrast in HRTEM. High-angle detection annular dark field scanning transmission electron microscopy (HAADF-STEM) as illustrated in Fig.1 is a solution of the problem without contrast reversal due to the lens-defocus and thickness-variation of samples.

Type
Phase Transformations in Metals and Alloys
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 719 - 720
Copyright
Copyright © Microscopy Society of America 1997

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References

[1]Mizutani, U.et al. J. Phys. C, (1997), in print.Google Scholar
[2]Hirotsu, Y.et al.: Jp. J. Appl. Phys., 59 (1984) L478.Google Scholar
[3]MacGibbon, M.M.et al.: Science, 266 (1994) 102.10.1126/science.266.5182.102CrossRefGoogle Scholar
[4]Pennycook, S.J.et al.: J. Electron Microsc., 45 (1996) 36.10.1093/oxfordjournals.jmicro.a023410CrossRefGoogle Scholar
[5]Nellist, P. and Pennycook, S.J.: Science, (1997) in print.Google Scholar
[6] The present study is partly supported by the Division of Materials Science, U.S. Department of Energy, under contract DE-AC05-960R22464 with Lockheed Martin energy research Corp.Google Scholar