Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Newbury, D.E.
and
Williams, D.B.
2000.
The electron microscope: the materials characterization tool of the millennium.
Acta Materialia,
Vol. 48,
Issue. 1,
p.
323.
Hansen, K.
and
Troger, L.
2000.
A novel multicell silicon drift detector module for X-ray spectroscopy and imaging applications.
IEEE Transactions on Nuclear Science,
Vol. 47,
Issue. 6,
p.
2748.
Wollman, D. A.
Newbury, Dale E.
Nam, S. W.
Hilton, G. C.
Irwin, K. D.
Rudman, D. A.
Deiker, S.
Bergren, N. F.
and
Martinis, John M.
2000.
Microcalorimeter EDS: Benefits and Drawbacks.
Microscopy and Microanalysis,
Vol. 6,
Issue. S2,
p.
738.
Strüder, L
2000.
High-resolution imaging X-ray spectrometers.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 454,
Issue. 1,
p.
73.
Lechner, P.
Fiorini, C.
Hartmann, R.
Kemmer, J.
Krause, N.
Leutenegger, P.
Longoni, A.
Soltau, H.
Stötter, D.
Stötter, R.
Strüder, L.
and
Weber, U.
2001.
Silicon drift detectors for high count rate X-ray spectroscopy at room temperature.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 458,
Issue. 1-2,
p.
281.
Smith, Paul
Gannon, John
and
Eggert, Frank
2001.
New Technologies for Microanalysis and Element Imaging in THJ Scanning Electron Microscope.
Microscopy and Microanalysis,
Vol. 7,
Issue. S2,
p.
884.
Guazzoni, C.
Sampietro, M.
Fazzi, A.
and
Lechner, P.
2001.
Two-chip charge amplifier system for high resolution, high count rate readout.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 458,
Issue. 1-2,
p.
370.
Pahlke, S
Fabry, L
Kotz, L
Mantler, C
and
Ehmann, T
2001.
Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’.
Spectrochimica Acta Part B: Atomic Spectroscopy,
Vol. 56,
Issue. 11,
p.
2261.
Smith, Paul
Gannon, John
and
Eggert, Frank
2001.
A New Methodology for Element Imaging in the Scanning Electron Microscope.
Microscopy and Microanalysis,
Vol. 7,
Issue. S2,
p.
1054.
Miller, Peter
and
MacRae, Colin
2002.
Industrial Applications Of Electron Microscopy.
Braun, Wolfgang
and
Ploog, Klaus H.
2003.
Real-time surface composition and roughness analysis in MBE using RHEED-induced X-ray fluorescence.
Journal of Crystal Growth,
Vol. 251,
Issue. 1-4,
p.
68.
Waters, William F.
Magill, Richard A.
Bray, George A.
Volaufova, Julia
Smith, Steven R.
Lieberman, Harris R.
Rood, Jennifer
Hurry, Mark
Anderson, Tai
and
Ryan, Donna H.
2003.
A Comparison of Tyrosine against Placebo, Phentermine, Caffeine, andd-Amphetamine During Sleep Deprivation.
Nutritional Neuroscience,
Vol. 6,
Issue. 4,
p.
221.
Osmic, F
Wobrauschek, P
Streli, C
Pahlke, S
and
Fabry, L
2003.
Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications.
Spectrochimica Acta Part B: Atomic Spectroscopy,
Vol. 58,
Issue. 12,
p.
2123.
Goldstein, Joseph I.
Newbury, Dale E.
Echlin, Patrick
Joy, David C.
Lyman, Charles E.
Lifshin, Eric
Sawyer, Linda
and
Michael, Joseph R.
2003.
Scanning Electron Microscopy and X-ray Microanalysis.
p.
297.
Lechner, P.
Pahlke, A.
and
Soltau, H.
2004.
Novel high‐resolution silicon drift detectors.
X-Ray Spectrometry,
Vol. 33,
Issue. 4,
p.
256.
Chen, Z.Y
Wan, B.N
Shi, Y.J
Hu, L.Q
Lin, S.Y
Hu, Q.S
and
Lui, S.X
2004.
A compact soft X-ray PHA in the HT-7 tokamak.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 527,
Issue. 3,
p.
604.
Zhongyong, Chen
Baonian, Wan
Yuejiang, Shi
Shiyao, Lin
and
Liqun, Hu
2005.
New Soft x-ray PHA Diagnostic in the HT-7 Tokamak.
Plasma Science and Technology,
Vol. 7,
Issue. 3,
p.
2813.
Karydas, A.G.
Brecoulaki, X.
Pantazis, Th.
Aloupi, E.
Argyropoulos, V.
Kotzamani, D.
Bernard, R.
Zarkadas, Ch.
and
Paradellis, Th.
2005.
X-rays for Archaeology.
p.
27.
Bjeoumikhov, A.
Bjeoumikhova, S.
Wedell, R.
Gubzhokov, R.
and
Margushev, Z.
2006.
A new method of depth sensitive micro-X-ray fluorescence analysis.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 248,
Issue. 1,
p.
142.
Meyer, Ulrich
Bühner, Martin
Büchter, Andre
Kruse‐Lösler, Birgit
Stamm, Thomas
and
Wiesmann, Hans Peter
2006.
Fast element mapping of titanium wear around implants of different surface structures.
Clinical Oral Implants Research,
Vol. 17,
Issue. 2,
p.
206.