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Imaging, Spectroscopy and Tomography of Frozen Hydrated Specimens With the Cryo Scanning Transmission X-Ray Microscope at The NSLS

Published online by Cambridge University Press:  02 July 2020

J. Maser ,
C. Jacobsen ,
Y. Wang ,
A. Osanna ,
B. Winn  and
J. Kirz
J. Maser
Affiliation:
State University of New York at Stony Brook. Current Address: Experimental Facilities Division, Argonne National Laboratory, Argonne, IL, 60439
C. Jacobsen
Affiliation:
Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, NY 11794-3800.
Y. Wang
Affiliation:
Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, NY 11794-3800.
A. Osanna
Affiliation:
Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, NY 11794-3800.
B. Winn
Affiliation:
Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, NY 11794-3800.
J. Kirz
Affiliation:
Department of Physics and Astronomy, State University of New York at Stony Brook, Stony Brook, NY 11794-3800.
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Extract

With the steady improvement of x-ray optics with high resolution and efficiency, and continued development or adaptation of different imaging and measuring techniques, soft x-ray microscopy has emerged as a powerful method to image and analyze fully hydrated specimens of several micrometer thickness at sub-optical resolution (for a recent overview, see ref. 1). We report on experiments performed with the cryo scanning transmission x-ray microscope (cryo-STXM), which has recently come into operation at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory.

Cryo-STXM uses x-rays with energies between the absorption edge of Carbon (E = 284 eV) and Oxygen (E = 543 eV) from the soft x-ray undulator at the NSLS. Fully hydrated specimens such as eucaryotic cells in water or ice layers of up to 10 micrometer thickness can be imaged without any additional need for contrast enhancing techniques.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 354 - 355
Copyright
Copyright © Microscopy Society of America

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References

1. Kirz, J. et. al, Quart. Rev. Biophys, 28 (1) (1995), 33.CrossRefGoogle Scholar

2. Maser, J. et. al. In: J. Thieme at. al., eds. X-ray Microscopy and Spectromicroscopy. Springer Series in Optical Sciences, (1997).Google Scholar

3. The authors gratefully acknowledge support from the Office of Biological and Environmental Research, U.S. DoE under contract DE-FG02-89ER60858, the National Science Foundation under grants DBI- 9605045 and ECS-9510499, and the Alexander von Humboldt-Foundation (Feodor-Lynen Fellowship to JM). This work was performed in part at the National Synchrotron Light Source which is operated by the Department on Energy.Google Scholar