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In Situ Tem Study of Inert Fillers in Liquid Environment

Published online by Cambridge University Press:  02 July 2020

W.-A. Chiou ,
Y.-C. Lee ,
A. Ishikawa ,
H. Konishi ,
K. Fukushima  and
D. F. Shriver
W.-A. Chiou
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL60208
Y.-C. Lee
Affiliation:
Departmet of Chemistry, Northwestern University, Evanston, IL60208
A. Ishikawa
Affiliation:
Department of Physics, Nihon University, Sakurajosui, Setagaya-Ku, Tokyo 156, Japan
H. Konishi
Affiliation:
Department of Physics, Nihon University, Sakurajosui, Setagaya-Ku, Tokyo 156, Japan
K. Fukushima
Affiliation:
JEOL Ltd., 1-2 Musashino, 3-Chome, Akishima, Tokyo 196, Japan
D. F. Shriver
Affiliation:
Departmet of Chemistry, Northwestern University, Evanston, IL60208
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Extract

Polymer electrolytes are a topic of interest because of their potential applications in electrochemical devices. However, very few systems exhibit both high conductivities and mechanical strength. Composite polymer electrolytes, composed of conventional polymer electrolytes and inert fillers, provide an avenue to enhance mechanical strength while maintaining ionic conductivity, if the particle sizes of these inert fillers are sufficiently small (< 1 μm in diameter). The determination of the morphology for these inert fillers in polymer matrixes was undertaken to further our understanding of ion transport phenomena in these composite systems. This paper presents an in situobservation of inert fillers in liquid media using environmental TEM.

Surface-modified fume silica was prepared by a two-step process. (1) SiCl4 was used to activate surface silanol (SiOH) groups and generate reactive SiCl groups on the surface of fume silica particles (Aldrich, 7 nm in diameter).

Type
Developments in Measuring Polymer Microstructures
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 820 - 821
Copyright
Copyright © Microscopy Society of America

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References

1. Khan, S. A. et al., Chetn. Mater., 6 (1994) 2359CrossRefGoogle Scholar

2. Fukami, A. et. al., EMSA Proceedings, 45 (1987) 142Google Scholar

3. This research made use of MRC Facilities supported by the NSF(DMR-9632742) at NU.Google Scholar