Hostname: page-component-84b7d79bbc-4hvwz Total loading time: 0 Render date: 2024-07-28T06:34:18.406Z Has data issue: false hasContentIssue false
  • English
  • Français

In-SituEELS Analysis of Cobalt Valence in La1-xSrxCoO3-y

Published online by Cambridge University Press:  02 July 2020

J.S. Yin  and
Z.L. Wang
J.S. Yin
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332
Z.L. Wang
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332
Get access

Extract

Transition and rare earth metal elements have played a vital role in synthesis of functional and smart materials because of their unique electronic structures and mixed valences. Experimental measurement of the valence states is thus important for understanding the mechanism which drives the functional properties. Lai1.xSrxCoO3-y(LSCO), for example, is an ionic conductor with potential applications in fuel cells and many other fields. In this type of materials, the anion deficiency is directly associated with the ratio of Co2+/Co3+ (or Co3+/Co4+) present in the specimen. It is known that the anion deficiency of the material depends on the operation temperature, but a direct measurement of anion deficiency is a challenge to existing microscopy techniques. In this paper, we present the in-situ analysis of Co valence in LSCO using electron energy-loss spectroscopy (EELS) in a transmission electron microscope.

LSCO thin films (with x = 0.5) were grown on polished MgO(00l) substrate by liquid source metal-organic chemical vapor deposition (MOCVD) method [1].

Type
In Situ Studies in Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 599 - 600
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Zhang, J., et al, Appl. Phys. Lett., 61, 2884 (1992)CrossRefGoogle Scholar

2. Wang, Z.L. and Yin, J.S., in these proceedings.Google Scholar

3. Pearson, D.H., Ahn, C.C., and Fultz, B., hys. Rev. B, 47, 8471 (1993)CrossRefGoogle Scholar

4. Wang, Z.L., Yin, J.S., Jiang, Y.D., and Zhang, J., submitted (1997).Google Scholar

5. Wang, Z.L. and Zhang, J., Phys. Rev. B, 54, 1153 (1996)CrossRefGoogle Scholar

6. Zener, C., Phys. Rev., 100, 675 (1955)Google Scholar