Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
2009.
Introduction to Texture Analysis.
p.
411.
SAOWADEE, N.
AGERSTED, K.
and
BOWEN, J.R.
2012.
Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia.
Journal of Microscopy,
Vol. 246,
Issue. 3,
p.
279.
SAOWADEE, N.
AGERSTED, K.
UBHI, H.S.
and
BOWEN, J.R.
2013.
Ion beam polishing for three‐dimensional electron backscattered diffraction.
Journal of Microscopy,
Vol. 249,
Issue. 1,
p.
36.
Brodusch, Nicolas
Boisvert, Sophie
and
Gauvin, Raynald
2013.
Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloys.
Microscopy,
Vol. 62,
Issue. 3,
p.
411.
Fang, Fengzhou
and
Xu, Zongwei
2013.
Handbook of Manufacturing Engineering and Technology.
p.
1.
Poplawsky, Jonathan D.
Paudel, Naba R.
Li, Chen
Parish, Chad M.
Leonard, Donovan
Yan, Yanfa
and
Pennycook, Stephen J.
2014.
Direct Imaging of Cl‐ and Cu‐Induced Short‐Circuit Efficiency Changes in CdTe Solar Cells.
Advanced Energy Materials,
Vol. 4,
Issue. 15,
Bassim, Nabil
Scott, Keana
and
Giannuzzi, Lucille A.
2014.
Recent advances in focused ion beam technology and applications.
MRS Bulletin,
Vol. 39,
Issue. 4,
p.
317.
Fang, Fengzhou
and
Xu, Zongwei
2015.
Handbook of Manufacturing Engineering and Technology.
p.
1279.
Poplawsky, Jonathan D.
Li, Chen
Paudel, Naba R.
Guo, Wei
Yan, Yanfa
and
Pennycook, Stephen J.
2016.
Nanoscale doping profiles within CdTe grain boundaries and at the CdS/CdTe interface revealed by atom probe tomography and STEM EBIC.
Solar Energy Materials and Solar Cells,
Vol. 150,
Issue. ,
p.
95.
Poplawsky, Jonathan D.
Guo, Wei
Paudel, Naba
Ng, Amy
More, Karren
Leonard, Donovan
and
Yan, Yanfa
2016.
Structural and compositional dependence of the CdTexSe1−x alloy layer photoactivity in CdTe-based solar cells.
Nature Communications,
Vol. 7,
Issue. 1,
Briot, Nicolas J.
and
Balk, T. John
2018.
Electron Backscatter Diffraction Measurement of Structural Reorientation after Nanoindentation of Nanoporous Gold.
MRS Advances,
Vol. 3,
Issue. 8-9,
p.
487.
Poplawsky, Jonathan D.
Dutta, Pavel
Guthrey, Harvey
Leonard, Donovan
Guo, Wei
Kacharia, Mitsul
Rathi, Monika
Khatiwada, Devendra
Favela, Carlos
Sun, Sicong
Zhang, Chuanze
Hubbard, Seth
and
Selvamanickam, Venkat
2020.
Directly Linking Low-Angle Grain Boundary Misorientation to Device Functionality for GaAs Grown on Flexible Metal Substrates.
ACS Applied Materials & Interfaces,
Vol. 12,
Issue. 9,
p.
10664.
van Leer, Brandon
Casalena, Lee
Graham, Jeremy
and
Winiarski, Bartlomiej
2020.
Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
898.
Wolff, Annalena
2021.
Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?.
Beilstein Journal of Nanotechnology,
Vol. 12,
Issue. ,
p.
965.