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Mephisto: A Novel Synchrotron Imaging Photoelectron Spectromicroscope

Published online by Cambridge University Press:  02 July 2020

Gelsomina De Stasio
Gelsomina De Stasio*
Affiliation:
Institut de Physique Appliquée, Ecole Polytechnique Fédérale, CH-1015, Lausanne, Switzerland, and Istituto di Struttura della Materia del CNR, Via Fosso del Cavaliere, 1-00133, Roma, Italy.
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Extract

We discuss the scheme and test performances of the recently commissioned MEPHISTO system in its final configuration. The tests show that the improvements in the electron optics system with respect to other instruments in the same class made it possible to reach lateral resolutions in the 50 nm range. They also demonstrate rather good spectromicroscopy and spectroscopy performances, reliability and flexibility of operation.

This instrument belongs to the class of the electron-imaging systems, like the PEEM (PhotoElectron Emission Microscope) [1] and the X-PEEM (X-ray PhotoElectron Emission Microscope) Microscope [2-5], Our new instrument, called MEPHISTO from the French acronym “Microscope a Emission de Photo électrons par Illumination Synchrotronique de type Onduleur” (Photoelectron Emission Microscope by Synchrotron Undulator Illumination) shares the good characteristics of the instruments of its class: real-time chemical imaging, fast taking of local x-ray absorption spectra, high spatial resolution, large dynamic range, flexibility and user-friendliness.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 358 - 359
Copyright
Copyright © Microscopy Society of America

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References

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