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Microstructure of YBCO/Co-PBCO/YBCO edge Josephson junctions

Published online by Cambridge University Press:  02 July 2020

Y. Huang
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439
B.H. Moeckly
Affiliation:
Conductus, Inc.969 W. Maude Ave., Sunnyvale, CA94086
K.L. Merkle
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439
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Extract

In recent years, many efforts have been made to fabricate high-Tc superconductor/normal-metal/ superconductor (SNS) Josephson junctions, but no breakthrough has been made. The major difficulties are the poor reproducibility of the junction parameters due to the structural complexity and defects in the barrier layer. Some junctions, such as the one with Co-doped YBCO barrier, have relatively small spreads in properties. However, the value of their normal state resistance Rn is low, which limits their use for many applications. One approach to solve this “low-Rn” problem is to use materials of high resistivity for the barrier layer. PBCO is an insulator near the metal-insulator transition. Doping with Co drives it further into the insulating regime. The lattice constants of PBCO are close to that of YBCO, even closer when doped with Co. Therefore, Co-PBCO may form a high-resistivity barrier which matches with YBCO very well and hence is a potential candidate barrier material.

Type
Microscopy of Semiconducting and Superconducting Materials
Copyright
Copyright © Microscopy Society of America

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References

References:

1Char, K., Colclough, M.S., Geballe, T.H. and Myers, K.E., Appl.Phys.Lett. 62, 196 (1993).CrossRefGoogle Scholar
2Moeckly, B.H. and Char, K., appl.phys.lett. 71, 2526 (1997).CrossRefGoogle Scholar
3Huang, Y., Merkle, K.L. and Char, K., Microscopy and. Microanalysis. 3, 108 (1997).CrossRefGoogle Scholar
4Huang, Y. and Merkle, K. L., Mat.Res.Soc.Symp.proc. 480, 497 (1997).CrossRefGoogle Scholar
5. The authors want to thank R.Csencsits for help in HREM work. This work is supported by NSF (contract #DMR 91-210000(YH)) and DOE (contract #W-31-109-ENG-38(KLM)).Google Scholar