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Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis

Published online by Cambridge University Press:  03 August 2008

JM Zuo ,
WJ Huang ,
A Shah  and
R Kröeger
JM Zuo
Affiliation:
University of Illinois
WJ Huang
Affiliation:
University of Illinois
A Shah
Affiliation:
University of Illinois
R Kröeger
Affiliation:
University of Illinois
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 920 - 921
Copyright
© 2008 Microscopy Society of America

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