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New Approaches for Energy Filtered Imaging and EELS Analysis

Published online by Cambridge University Press:  02 July 2020

G.A. Botton
G.A. Botton*
Affiliation:
Materials Technology Laboratory, Natural Resources Canada, 568 Booth St, Ottawa, K1A 0G1Canada
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Extract

Electron energy-loss spectroscopy imaging is now becoming an established and indispensable tool in high-resolution materials characterization. Whether the imaging approach is based on post column filters attached to a conventional transmission electron microscope (TEM) or on parallel spectrometers on a scanning (field emission) TEM, energy filtered (EF) microscopy is having a significant impact in materials science (e.g. Ref. 1). Elemental mapping, however, is not the only imaging tool accessible with EF microscopy. EELS images and spectra are often only part of the data that is obtained when samples are characterized in an analytical TEM. Complementary information is also obtained from EDS spectra which are often analyzed independently from the EELS data and from EELS near edge structures. When the EELS fine structure is altered due to changes in chemical state of the probed atoms, additional information is accessible and can potentially be used in novel methods of image acquisition.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 172 - 173
Copyright
Copyright © Microscopy Society of America

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References

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