Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T00:04:14.300Z Has data issue: false hasContentIssue false

New Technique for Ultra-thin Serial Brain Section Imaging Using Scanning Electron Microscopy

Published online by Cambridge University Press:  05 August 2007

N Kasthuri
Affiliation:
Harvard Univeristy
K Hayworth
Affiliation:
University of Southern California
J Lichtman
Affiliation:
Harvard University
N Erdman
Affiliation:
JEOL
CA Ackerley
Affiliation:
Hospital for Sick Children
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)