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Performance of Monochromized and Aberration-Corrected TEMs

Published online by Cambridge University Press:  01 August 2004

Gerd Benner ,
Erik Essers ,
Marko Matijevic ,
Alexander Orchowski ,
Peter Schlossmacher ,
Alexander Thesen ,
Maximilian Haider  and
Peter Hartel
Gerd Benner
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Erik Essers
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Marko Matijevic
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Alexander Orchowski
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Peter Schlossmacher
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Alexander Thesen
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Maximilian Haider
Affiliation:
CEOS, Heidelberg, Germany
Peter Hartel
Affiliation:
CEOS, Heidelberg, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 108 - 109
Copyright
© 2004 Microscopy Society of America

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