Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-12-01T03:42:53.822Z Has data issue: false hasContentIssue false
  • English
  • Français

Practical Autotuning for Transmission Electron Microscopes

Published online by Cambridge University Press:  02 July 2020

M. Pan
M. Pan*
Affiliation:
Gatan R&D, 5933 Coronado Lane, Pleasanton, CA, 94588
Get access

Extract

There are three main algorithms for autotuning a transmission electron microscope (TEM), (1) image variance method, (2) tilt-induced image shift (TIS) method, and (3) automated diffractogram analysis method (ADA). In practice, each method has its own advantages and limitations. Therefore it is necessary to obtain a comprehensive understanding of each in order to be able to select the most appropriate one(s).

There are four key elements in any TEM autotuning setup, (1) microscope control by an external computer, for example via the standard RS232 serial port; (2) proper image acquisition device, for example a TV or a slow-scan CCD camera; (3) appropriate software for image analysis, processing, and optimization; (4) a fast computer that is the central control unit in the setup and dictates all the activities and operations.

Type
Advances in Remote Microscopy, Instrument Automation and Data Storage
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 52 - 53
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Saxton, W.O. et al., J. Microscopy 130 (1983) 187.CrossRefGoogle Scholar
2.Saxton, W.O., Proc. 45th Ann. Meet. EMSA, Baltimore, MD (1987) 58.Google Scholar
3.Smith, D.J. et al, Proc. 45th Ann. Meet. EMSA, Baltimore, MD (1987) 62Google Scholar
4.Koster, A.J. et al, Ultramicroscopy 27 (1989) 251.CrossRefGoogle Scholar
5.Koster, A.J. and de Ruijter, W.J., Ultramicroscopy 40 (1992) 89.CrossRefGoogle Scholar
6.Fan, G.Y. and Krivanek, O.L., Proc. 12th Int. Congr. Electron Micros., Seattle, WA, 1990, Vol. 1, Eds. L.D. Peachey and D.B. Williams, 154.Google Scholar
7.Krivanek, O.L. and Fan, G.Y., Scan. Micros. Suppl. 6 (1992) 105.Google Scholar
8. The author is grateful to Dr. O.L. Krivanek for many stimulating discussions on this subject.Google Scholar