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Quantitative Information from Image Processing in ADF Stem

Published online by Cambridge University Press:  02 July 2020

P.D. Nellist  and
S.J. Pennycook
P.D. Nellist
Affiliation:
Cavendish Laboratory, University of Cambridge, CambridgeCB3 OHE, UK
S.J. Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN37831-6030
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Extract

Annular dark-field (ADF) imaging in the scanning transmission electron microscope (STEM) at atomic resolution can be regarded as being almost perfect incoherent imaging, which has two major advantages over conventional high-resolution transmission electron microscopy (HRTEM), which is close to being perfectly coherent: Firstly, the images formed are direct structure images of the projected atomic structure, with regions of intensity located at the positions of the atomic columns. Secondly, the images can be written as the convolution between two real and positive functions: a point-spread function given by the intensity of the STEM probe, and an object function that consists of narrow, almost <5-function-like, peaks located exactly over the nuclei of the atomic columns. Thus there is no phase problem in ADF STEM imaging, unlike in conventional HRTEM where phase retrieval techniques such as holography are often employed.

The lack of a phase problem in ADF STEM imaging creates immediate opportunities for image processing.

Type
Computational Methods for Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1149 - 1150
Copyright
Copyright © Microscopy Society of America 1997

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References

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