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Reactive Multilayers Examined by HRTEM and Plasmon EELS Chemical Mapping

Published online by Cambridge University Press:  15 January 2009

M.A. Mat Yajid  and
G. Möbus
M.A. Mat Yajid*
Affiliation:
Department of Engineering Materials, University of Sheffield, Sheffield S1 3JD, UK
G. Möbus
Affiliation:
Department of Engineering Materials, University of Sheffield, Sheffield S1 3JD, UK
*
Corresponding author. E-mail: m.azizi@sheffield.ac.uk
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Abstract

We examine chemical mapping of reaction phases in a Cu-Al multilayer system using low-loss electron energy loss spectroscopy spectrum imaging and image spectroscopy techniques. The sensitivity of the plasmon peak position and shape to various crystal structures and phases is exploited using postprocessing of spectra into second derivative plasmon maps and line scans. Analytical transmission electron microscopy is complemented by studies of the orientation relationship of the multilayer system using high-resolution electron microscopy of interfaces and selected area diffraction. The techniques have been applied to the Cu-Al multilayer sample and sharply bound epitaxial phases are found, before and after heat treatment.

Keywords

Cu-AlCuAl2metallic multilayersplasmon mappingelectron energy loss spectroscopyenergy filtered transmission electron microscopy (EFTEM)chemical mapping
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 1 , February 2009 , pp. 54 - 61
Copyright
Copyright © Microscopy Society of America 2009

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References

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