Hostname: page-component-77c89778f8-sh8wx Total loading time: 0 Render date: 2024-07-19T22:25:11.169Z Has data issue: false hasContentIssue false

Structural Fluctuations in Metal Nanoparticles

Published online by Cambridge University Press:  02 July 2020

Miyoko Tanaka
Affiliation:
National Research Institute for Metals, 3-13, Sakura, Tsukuba, 305-0003, JAPAN
Masaki Takeguchi
Affiliation:
National Research Institute for Metals, 3-13, Sakura, Tsukuba, 305-0003, JAPAN
Kazuo Furuya
Affiliation:
National Research Institute for Metals, 3-13, Sakura, Tsukuba, 305-0003, JAPAN
Get access

Extract

The structure of small particles attracts great interest for their distinctiveness. Small particles of several materials undergo lattice parameter change or crystal structure change and sometimes form multiply twinned particles (MTPs) [1]. Configurational and structural fluctuations which they show under electron beam irradiation are also interesting phenomena [2]. This quasi-molten state are well explained theoretically [3], but the exact cause of it is still a matter of debate [2,4].

To clarify the behavior of nanoparticles under electron beam more precisely, we grew indium, palladium and molybdenum nanoparticles on Si (110) TEM samples in situ and investigated with an ultrahigh vacuum field emission transmission electron microscope (UHV-FE-TEM). It is a JEOL-2000VF operated at 200 kV with a base pressure of the column less thari 2.0 x 1O−8 Pa. Two kinds of evaporators are attached to the column in order to perform in situ evaporation of metals; an electron beam (EB) evaporator for high melting temperature material and a thermal heating evaporator with tungsten wire for low melting temperature ones.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Ino, S., J. Phys. Soc. Jpn 27, 941; Howie, A. and Marks, L.D., Phil. Mag. 49, 95 (1984)Google Scholar
2.Iijima, S. and Ichihashi, T., Phys. Rev. Lett. 56, 616 (1986); Smith, D.J., Petford-Long, A.K., Wallenberg, L.R. and Bovin, J.O., Science 233, 872 (1986)CrossRefGoogle Scholar
3.Ajayan, P.M. and Marks, L.D., Phys. Rev. Lett. 60, 585 (1988)CrossRefGoogle Scholar
4.Howie, A., Nature 320, 684 (1986); Williams, P., Appl. Phys. Lett. 50, 1760 (1987)CrossRefGoogle Scholar
5.Tanaka, M, Takeguchi, M. and Furuya, K., Surf. Sci. to be published.Google Scholar
6.Tanaka, M., Furuya, K., Takeguchi, M. and Honda, T., Thin Solid Films 319, 110 (1998)CrossRefGoogle Scholar