Hostname: page-component-84b7d79bbc-5lx2p Total loading time: 0 Render date: 2024-07-28T15:04:58.645Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure And Composition Of Grain Boundaries In SrTiO3

Published online by Cambridge University Press:  02 July 2020

O. Kienzle ,
F. Ernst  and
Manfred Rühle
O. Kienzle
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, Germany
F. Ernst
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, Germany
Manfred Rühle
Affiliation:
Max-Planck-Institut fur Metallforschung, Seestr. 92, D-70174, Stuttgart, Germany
Get access

Extract

The electrical properties of SrTiO3 (strontium titanate) ceramics are strongly influenced or even dictated by grain boundary segregation of charged point defects, such as dopant atoms, impurities, vacancies, or self-interstitials. The atomistic structure of the grain boundaries, their energy, and the segregation of point defects mutually depend on each other. Grain boundary segregation of charged point defects induces the formation of space charge layers in the adjoining crystals. In order to investigate the relation between grain boundary structure and composition, grain boundaries in Fedoped SrTiO3 bicrystals and in SrTiO3 ceramics were studied by HRTEM and by AEM with subnanometer resolution.

Quantitative HRTEM served to investigate the atomistic structure of Σ=3, (111) grain boundaries in Fe-doped SrTiO3 bicrystals with a doping level of Fe/Ti= 0.04at% (Fig. 1). Analysis of the translation state revealed that the Σ=3, (111) grain boundary has an excess volume: normal to the boundary plane, the spacing between the two crystals exceeds what one would expect from a coincidence site lattice model by (0.06 ±0.01 )nm.

Type
Atomic Structure And Microchemistry Of Interfaces
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 94 - 95
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Maier, J., Solid State Ionics, 75 (1995) 139–145CrossRefGoogle Scholar
2.Kienzle, O. and Ernst, F., J. Am. Ceram. Soc, 80 (1997) 1639–1644CrossRefGoogle Scholar
3.Kienzle, O., Exner, M., Ernst, F., phys. stat. sol. (a), 166 (1998) 57–713.0.CO;2-S>CrossRefGoogle Scholar
4.Clarke, D.R., Ann. Rev. Mater. Sci., 17 (1987) 57CrossRefGoogle Scholar