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Three-Dimensional Analysis of Solid Oxide Fuel Cell Ni-YSZ Anode Interconnectivity

Published online by Cambridge University Press:  15 January 2009

James R. Wilson ,
Marcio Gameiro ,
Konstantin Mischaikow ,
William Kalies ,
Peter W. Voorhees  and
Scott A. Barnett
James R. Wilson
Affiliation:
Department of Materials Science, Northwestern University, 2220 Campus Dr., Evanston, IL 60208, USA
Marcio Gameiro
Affiliation:
Department of Mathematics, Rutgers University, 110 Frelinghusen Rd., Piscataway, NJ 08854, USA
Konstantin Mischaikow
Affiliation:
Department of Mathematics, Rutgers University, 110 Frelinghusen Rd., Piscataway, NJ 08854, USA
William Kalies
Affiliation:
Department of Mathematics, Florida Atlantic University, 777 Glades Rd., Boca Raton, FL 33431, USA
Peter W. Voorhees
Affiliation:
Department of Materials Science, Northwestern University, 2220 Campus Dr., Evanston, IL 60208, USA
Scott A. Barnett*
Affiliation:
Department of Materials Science, Northwestern University, 2220 Campus Dr., Evanston, IL 60208, USA
*
Corresponding author. E-mail: s-barnett@northwestern.edu
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Abstract

A method is described for quantitatively analyzing the level of interconnectivity of solid-oxide fuel cell electrode phases. The method was applied to the three-dimensional microstructure of a Ni–Y2O3-stabilized ZrO2 (Ni-YSZ) anode active layer measured by focused ion beam scanning electron microscopy. Each individual contiguous network of Ni, YSZ, and porosity was identified and labeled according to whether it was contiguous with the rest of the electrode. It was determined that the YSZ phase was 100% connected, whereas at least 86% of the Ni and 96% of the pores were connected. Triple-phase boundary (TPB) segments were identified and evaluated with respect to the contiguity of each of the three phases at their locations. It was found that 11.6% of the TPB length was on one or more isolated phases and hence was not electrochemically active.

Keywords

FIB-nanotomographymicrostructureanodeSOFCNi-YSZ3DFIB-SEMconnectivity
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 1 , February 2009 , pp. 71 - 77
Copyright
Copyright © Microscopy Society of America 2009

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