Hostname: page-component-77c89778f8-gq7q9 Total loading time: 0 Render date: 2024-07-23T02:35:21.206Z Has data issue: false hasContentIssue false
  • English
  • Français

Uncoated Lvsem and Imaging Tof-Sims of Unfixed, Plunge Frozen, Freeze Dried, Fungal and Plant Material

Published online by Cambridge University Press:  02 July 2020

E. J. Basgall  and
N. Winograd
E. J. Basgall
Affiliation:
Department of Chemistry, The Pennsylvania State University, University Park, PA16802-7003
N. Winograd
Affiliation:
Department of Chemistry, The Pennsylvania State University, University Park, PA16802-7003
Get access

Extract

A Cryosorption Freeze Drying (CFD) system was evaluated for its effectiveness in preparing delicate biological materials for both low voltage-field emission scanning electron microscopy (LVFESEM) and imaging liquid metal (Ga) ion beam, static time-of-flight, secondary ion mass spectrometry (TOF-SIMS). The primary goals of these studies were to investigate the retention of both structural and chemical integrity using fresh cryoprepared biological material which had not been exposed to any chemical fixation and which would not be coated by any conductive material in order to obtain information from the native surfaces. Duplicate chemically fixed samples were processed for comparison. LV-FESEM (2-2.5kV) was used to assess the quality of the structural preservation of the freezing and freeze drying (FD) protocols. Imaging static TOF-SIMS was used to investigate the surface chemical compositions of the biological samples.

Type
Specimen Preparation
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 850 - 851
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. H., Sitte, et al. ScanningMicrosc. Suppl. 8(1994)47–66.Google Scholar

2. Ryan, K. P., Scanning Microsc. Vol.6 #3(1992)715–743.Google Scholar

3. Ryan, K. P. and Liddicoat, M. I., Jou. of Microsc. Vol.l47,pt3(1987)337–340.CrossRefGoogle Scholar

4. Hesk, D., et al. Jou. ofChem. Ecology Vol.18 #8(1992)1349–1364.CrossRefGoogle Scholar

5. Walters, D., et al. Jou. ofChem. Ecology Vol.1 #3(1990)877–886.CrossRefGoogle Scholar

6. Craig, R., et al. Geraniums-ACS Symposium Series #296(1986)168–176.CrossRefGoogle Scholar

7. Kern, W., Semiconductor Int'l. (April 1984)94–99.Google Scholar

8. The authors gratefully acknowledge the support of the National Institutes of Health.