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Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies

Published online by Cambridge University Press:  05 August 2007

CJ Zeissler ,
KC K Scott ,
RD Holbrook ,
PE Barker  and
Y Xiao
CJ Zeissler
Affiliation:
National Institute of Standards and Technology
KC K Scott
Affiliation:
National Institute of Standards and Technology
RD Holbrook
Affiliation:
National Institute of Standards and Technology
PE Barker
Affiliation:
National Institute of Standards and Technology
Y Xiao
Affiliation:
National Institute of Standards and Technology
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 292 - 293
Copyright
© 2007 Microscopy Society of America

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